发明名称 MEASUREMENT DEVICE, SEMICONDUCTOR DEVICE AND IMPEDANCE ADJUSTMENT METHOD
摘要 A measurement device includes an electric current generation circuit and a monitor device. The electric current generation circuit supplies an electric current whose electric current amount monotonically increases during a setup period of time to the electric circuit including a power supply. The monitor device detects a voltage of the power supply via the electric circuit. A frequency of the detected voltage having a waveform is a frequency at which the impedance of the electric circuit becomes high.
申请公布号 US2015084717(A1) 申请公布日期 2015.03.26
申请号 US201414492215 申请日期 2014.09.22
申请人 NEC Corporation 发明人 KATOH TOSHIHIRO
分类号 H03H7/01 主分类号 H03H7/01
代理机构 代理人
主权项 1. A measurement device comprising: an electric current generating circuit that supplies a measurement-target electric circuit including a power supply with an electric current whose electric current amount monotonically increases during a setup period of time; and a monitoring device that detects a voltage of the power supply via the electric circuit.
地址 Tokyo JP