发明名称 |
MEASUREMENT DEVICE, SEMICONDUCTOR DEVICE AND IMPEDANCE ADJUSTMENT METHOD |
摘要 |
A measurement device includes an electric current generation circuit and a monitor device. The electric current generation circuit supplies an electric current whose electric current amount monotonically increases during a setup period of time to the electric circuit including a power supply. The monitor device detects a voltage of the power supply via the electric circuit. A frequency of the detected voltage having a waveform is a frequency at which the impedance of the electric circuit becomes high. |
申请公布号 |
US2015084717(A1) |
申请公布日期 |
2015.03.26 |
申请号 |
US201414492215 |
申请日期 |
2014.09.22 |
申请人 |
NEC Corporation |
发明人 |
KATOH TOSHIHIRO |
分类号 |
H03H7/01 |
主分类号 |
H03H7/01 |
代理机构 |
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代理人 |
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主权项 |
1. A measurement device comprising:
an electric current generating circuit that supplies a measurement-target electric circuit including a power supply with an electric current whose electric current amount monotonically increases during a setup period of time; and a monitoring device that detects a voltage of the power supply via the electric circuit. |
地址 |
Tokyo JP |