| 摘要 |
<p>PROBLEM TO BE SOLVED: To inspect insulation between conductor patterns and inspect electronic components and also avoid the degradation of the electronic components while avoiding the complication of a configuration and the degradation of an inspection signal.SOLUTION: A circuit board inspection device comprises: a scanner 3 for separating all of probe pins 21 from a first inspection unit 4 and connecting a discretionary probe pin 21 to the first inspection unit 4; a second inspection unit 5 directly connected via wiring to the probe pins 21 which are in contact with a conductor pattern P configuring one conductor pattern group GP and connected to an electronic component; a power supply unit 8 for supplying voltage V1 to the first inspection unit 4 etc.; a floating power supply unit 9 for supplying, to the second inspection unit 5, voltage V2 which is electrically insulated from the voltage V1; and a control unit 6 for controlling the second inspection unit 5 at a time when the on/off state of a selector switch configuring the scanner 3 is switched and causing a DC rated voltage of a predefined value to be supplied from the second inspection unit 5 to all of the probe pins 21 connected via wiring with the second inspection unit 5.</p> |
