发明名称 |
VERIFICATION DEVICE OF SEMICONDUCTOR INTEGRATED CIRCUIT, VERIFICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT, AND PROGRAM |
摘要 |
PROBLEM TO BE SOLVED: To provide a verification method of semiconductor integrated circuits capable of achieving reduction in verification time.SOLUTION: In designing of the RTL description, the verification method of semiconductor integrated circuits models one memory into: a plurality of divided memories addressed by a part of address signals for designating addresses of the memory and having a capacity smaller than that of the memory; a first logical circuit for selecting a plurality of divided memories according to the residuals of the address signals; a delay circuit delaying the residuals of the address signals and outputting the delayed residuals of the address signals; and a second logical circuit selecting output from the divided memories in response to a signal from the delay circuit and defines it as output from the entire memory. |
申请公布号 |
JP2015055899(A) |
申请公布日期 |
2015.03.23 |
申请号 |
JP20130187085 |
申请日期 |
2013.09.10 |
申请人 |
TOSHIBA CORP |
发明人 |
KAWABE NAOYUKI;UCHIUMI TETSUAKI |
分类号 |
G06F17/50;G01R31/28 |
主分类号 |
G06F17/50 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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