发明名称 CHARGED PARTICLE BEAM DEVICE, SAMPLE OBSERVATION METHOD FOR CHARGED PARTICLE BEAM DEVICE, AND DISPLAY CONTROL PROGRAM FOR CHARGED PARTICLE BEAM DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To implement a charged particle beam device for enabling a user to acquire excellent data after minimum user learning, improve the user's skill through operation, and feel sense of accomplishment.SOLUTION: A charged particle beam device comprising a control unit for controlling a charged particle beam source, charged particle optical system, detector, sample stage, sample room, and image display device, displays a message for confirming, with an operator, whether a phenomenon of image distortion, brightness unevenness, lack of stereoscopic effect, or an image blur occurs in a sample image, a first button to be pushed by the operator when the phenomenon of image distortion, brightness unevenness, or lack of stereoscopic effect occurs in the sample image, and a second button to be pushed by the operator when the phenomenon of image blur occurs in the sample image, with the sample image on the display unit; and displays a message showing a cause according to an observation condition when the first button or the second button is pushed. Thereby, even a beginner can easily recognize quality of an imaging result and obtain a cause and solution, which improves his/her skill on the charged particle beam device to enable improvement of image quality.</p>
申请公布号 JP2015056398(A) 申请公布日期 2015.03.23
申请号 JP20140034608 申请日期 2014.02.25
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 NISHIMURA MASAKO;SHIGEFUJI NORIYUKI;ANDO TORU;IIIZUMI NORIKO;TAMOCHI RYUICHIRO;SATO MITSUGU;KONISHI YAYOI;NODA HIROYUKI;INADA TAKAHIRO
分类号 H01J37/28;H01J37/22;H01J37/24 主分类号 H01J37/28
代理机构 代理人
主权项
地址