| 摘要 |
An X-ray imaging system comprises: a source grating configured to convert each micro X-ray source of a micro X-ray source array into a plurality of even smaller X-ray sources; a beam splitter grating configured to diffract an X-ray having passed through the source grating and to form an interference pattern; an analyzer grating configured to have a pattern for forming moire with the interference pattern; and an X-ray detector configured to image the moire formed between the interference pattern and the pattern of the analyzer grating. |
