发明名称 POLYURETHANE POLISHING PAD
摘要 PROBLEM TO BE SOLVED: To provide a polishing pad suitable for planarizing semiconductor, optical, and magnetic substrates.SOLUTION: This polishing pad includes a cast polyurethane polymeric material formed from a prepolymer reaction of a polypropylene glycol and a toluene diisocyanate to form an isocyanate-terminated reaction product. The toluene diisocyanate has less than 5 weight percent aliphatic isocyanate; and the isocyanate-terminated reaction product has 5.55 to 5.85 weight percent unreacted NCO. The isocyanate-terminated reaction product is cured with a 4,4'-methylene-bis(3-chloro-2,6-diethylaniline) curative agent. The non-porous cured product has a tanδ of 0.04 to 0.10, a Young's modulus of 140 to 240 MPa and a Shore D hardness of 44 to 56.
申请公布号 JP2015051498(A) 申请公布日期 2015.03.19
申请号 JP20140178703 申请日期 2014.09.03
申请人 ROHM & HAAS ELECTRONIC MATERIALS CMP HOLDINGS INC;DOW GLOBAL TECHNOLOGIES LLC 发明人 YEH FENGJI;MARTY DEGROOT;JAMES MURNANE;JAMES DAVID B;KULP MARY JO
分类号 B24B37/24;C08G18/10;C08G18/66;C08G18/72;C08G18/76;C08J5/14;H01L21/304 主分类号 B24B37/24
代理机构 代理人
主权项
地址