发明名称 |
POLYURETHANE POLISHING PAD |
摘要 |
PROBLEM TO BE SOLVED: To provide a polishing pad suitable for planarizing semiconductor, optical, and magnetic substrates.SOLUTION: This polishing pad includes a cast polyurethane polymeric material formed from a prepolymer reaction of a polypropylene glycol and a toluene diisocyanate to form an isocyanate-terminated reaction product. The toluene diisocyanate has less than 5 weight percent aliphatic isocyanate; and the isocyanate-terminated reaction product has 5.55 to 5.85 weight percent unreacted NCO. The isocyanate-terminated reaction product is cured with a 4,4'-methylene-bis(3-chloro-2,6-diethylaniline) curative agent. The non-porous cured product has a tanδ of 0.04 to 0.10, a Young's modulus of 140 to 240 MPa and a Shore D hardness of 44 to 56. |
申请公布号 |
JP2015051498(A) |
申请公布日期 |
2015.03.19 |
申请号 |
JP20140178703 |
申请日期 |
2014.09.03 |
申请人 |
ROHM & HAAS ELECTRONIC MATERIALS CMP HOLDINGS INC;DOW GLOBAL TECHNOLOGIES LLC |
发明人 |
YEH FENGJI;MARTY DEGROOT;JAMES MURNANE;JAMES DAVID B;KULP MARY JO |
分类号 |
B24B37/24;C08G18/10;C08G18/66;C08G18/72;C08G18/76;C08J5/14;H01L21/304 |
主分类号 |
B24B37/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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