| 摘要 |
<p>The present invention relates to a data storage system which can improve reliability and yield of the device by performing the test operation when a reading operation of a memory block is failed and determining that the block is a bad block or not a bad block based on a result of the test operation. The operating method of a data storage system according to the present invention comprises the steps of: performing a test operation on a reading failed block; and determining the reading failed block as a bad block when the testing operation is failed.</p> |
