| 摘要 |
The present invention relates to a semiconductor device, a memory system and an operating method thereof, which are capable of improving the reliability of a read operation. The semiconductor device includes: a plurality of memory blocks including a plurality of pages; peripheral circuits configured to perform a least significant bit read operation and a most significant bit read operation of a selected page included in one selected among the memory blocks; and a control circuit including a least significant bit read-retry table and a most significant bit read-retry table which have a plurality of indexes composed of various read voltages, and configured to control the peripheral circuits to store an index used when error correction is possible among the indexes included in the least significant bit read-retry table in the least significant bit read operation and to perform the most significant bit read operation by first selecting the stored index among the indexes included in the most significant bit read-retry table. |
