发明名称 Variable resistance memory device with shunt gate connected to corresponding gate
摘要 A variable resistance memory device includes a semiconductor substrate having a vertical transistor with a shunt gate that increases an area of a gate of the vertical transistor.
申请公布号 US8981448(B2) 申请公布日期 2015.03.17
申请号 US201313795872 申请日期 2013.03.12
申请人 SK Hynix Inc. 发明人 Park Nam Kyun
分类号 H01L27/108;H01L29/788;H01L27/24;H01L21/8239;H01L29/78 主分类号 H01L27/108
代理机构 IP & T Group LLP 代理人 IP & T Group LLP
主权项 1. A variable resistance memory device, comprising: a semiconductor substrate having a length and a width; a plurality of vertical transistors, extending from a surface of the semiconductor substrate in a direction perpendicular to the length and the width of the semiconductor substrate, the plurality of vertical transistors being arranged at a fixed interval on the semiconductor substrate; a variable resistive region formed on each of the plurality of vertical transistors; and a shunt gate disposed in a space between adjacent vertical transistors and configured to be electrically connected to a gate of each of the plurality of vertical transistors.
地址 Gyeonggi-do KR