发明名称 |
Variable resistance memory device with shunt gate connected to corresponding gate |
摘要 |
A variable resistance memory device includes a semiconductor substrate having a vertical transistor with a shunt gate that increases an area of a gate of the vertical transistor. |
申请公布号 |
US8981448(B2) |
申请公布日期 |
2015.03.17 |
申请号 |
US201313795872 |
申请日期 |
2013.03.12 |
申请人 |
SK Hynix Inc. |
发明人 |
Park Nam Kyun |
分类号 |
H01L27/108;H01L29/788;H01L27/24;H01L21/8239;H01L29/78 |
主分类号 |
H01L27/108 |
代理机构 |
IP & T Group LLP |
代理人 |
IP & T Group LLP |
主权项 |
1. A variable resistance memory device, comprising:
a semiconductor substrate having a length and a width; a plurality of vertical transistors, extending from a surface of the semiconductor substrate in a direction perpendicular to the length and the width of the semiconductor substrate, the plurality of vertical transistors being arranged at a fixed interval on the semiconductor substrate; a variable resistive region formed on each of the plurality of vertical transistors; and a shunt gate disposed in a space between adjacent vertical transistors and configured to be electrically connected to a gate of each of the plurality of vertical transistors. |
地址 |
Gyeonggi-do KR |