发明名称 INFORMATION PROCESSING SYSTEM FOR INSPECTION, ABNORMALITY DETECTION DEVICE, ABNORMALITY DETECTION METHOD, AND PROGRAM
摘要 PROBLEM TO BE SOLVED: To provide an inspection system capable of identifying whether an error detected when an inspection is performed is caused by a device instructing execution of the instruction or caused by a device performing the inspection.SOLUTION: In an inspection system, a first device 1 transmits a signal including an identifier allocated to each of a plurality of inspection items contained in an inspection to a second device 2. The second device receives the signal transmitted by the first device. When the identifier contained in the received signal coincides with a pre-stored identifier, the second device transmits the signal to an inspection target device 3 to make it execute an inspection item corresponding to the identifier. When the identifier contained in the received signal does not coincide with a pre-stored identifier, the second device transmits no signal to the inspection target device and reports that an error occurs in the signal transmitted by the first device.
申请公布号 JP2015045926(A) 申请公布日期 2015.03.12
申请号 JP20130175560 申请日期 2013.08.27
申请人 NEC PLATFORMS LTD 发明人 OSANO HISASHI
分类号 G06F11/30;G06F11/22 主分类号 G06F11/30
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