发明名称 |
Backside Contacts for Integrated Circuit Devices |
摘要 |
A chip includes a semiconductor substrate, a well region in the semiconductor substrate, and a transistor formed at a front side of the semiconductor substrate. A source/drain region of the transistor is disposed in the well region. A well pickup region is disposed in the well region, wherein the well pickup region is at a back side of the semiconductor substrate. A through-via penetrates through the semiconductor substrate, wherein the through-via electrically inter-couples the well pickup region and the source/drain region. |
申请公布号 |
US2015069520(A1) |
申请公布日期 |
2015.03.12 |
申请号 |
US201314021881 |
申请日期 |
2013.09.09 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Lee Jam-Wem |
分类号 |
H01L27/092;H01L21/8238 |
主分类号 |
H01L27/092 |
代理机构 |
|
代理人 |
|
主权项 |
1. An integrated circuit structure comprising:
a first chip comprising:
a semiconductor substrate;a well region in the semiconductor substrate;a transistor formed at a front side of the semiconductor substrate, wherein a source/drain region of the transistor is disposed in the well region; anda well pickup region in the well region, wherein the well pickup region is at a back side of the semiconductor substrate. |
地址 |
Hsin-Chu TW |