发明名称 TEST PROBE ASSEMBLY AND RELATED METHODS
摘要 A test probe assembly includes a first elongate electrically conductive plunger that extends from a proximal first plunger end to a distal first plunger end, and is defined in part by a central longitudinal axis. The first plunger has a first spring latch at the distal first plunger end. At least a portion of the first plunger has an arc with a first plunger outer contact point opposite the first spring latch relative to the longitudinal axis. The first plunger is disposed in a spring. The first plunger outer contact point in contact with the inner diameter of the spring, and the first spring latch engages at least a portion of the spring. A method includes disposing a first plunger within a spring along a spring longitudinal axis, disposing a second probe within the spring along the spring longitudinal axis, and engaging the spring latch and the second plunger spring latch with the spring, for instance by capturing an end coil of the spring with the spring latch of at least one of the spring latch or the second plunger spring latch.
申请公布号 US2015070040(A1) 申请公布日期 2015.03.12
申请号 US201314394252 申请日期 2013.03.14
申请人 XCERRA CORPORATION 发明人 Treibergs Valts;Magnuson Aaron;Yakushev Sergey;Hanson Scott
分类号 G01R1/04;G01R1/067;G01R3/00 主分类号 G01R1/04
代理机构 代理人
主权项 1. A testing apparatus comprising: a spring component extending from a first spring end portion to a second spring end portion and having a spring intermediate portion, the spring intermediate portion having a spring inner diameter, the spring component including a coiled wire defined in part by a wire diameter; at least one testing component including a first elongate electrically conductive plunger extending from a distal end portion to a proximal end portion and having an intermediate portion therebetween, the first plunger disposed within the spring component; the intermediate portion of the first plunger having a central longitudinal axis, and defined in part by an intermediate outer dimension; the first plunger including a spring latch, the spring latch including a hook portion disposed at the distal end portion; and the distal end portion has a distal outer dimension at a base of the hook portion disposed at a greater distance from the central longitudinal axis than the outer dimension of the intermediate portion such that the hook portion encompasses a portion of the coiled wire when the testing component is in an uncompressed state.
地址 Norwood MA US