| 摘要 |
<p>The present invention provides a memory architecture and associated serial direct access (SDA) circuit. The memory architecture includes a memory of a parallel interface and a serial direct access (SDA) circuit. The SDA circuit includes an enable pin, a serial pin and an auto-test module. The enable pin receives an enable bit, wherein the SDA circuit is selectively enabled and disabled in response to the enable bit. When the SDA circuit is enabled, the serial pin sequentially relaying a plurality of serial bits, such that each of the serial bits is associated with one of parallel pins of the parallel interface; in addition, the auto-test module can perform a built-in test of the memory associated with the serial bits.</p> |
