发明名称 Exposure monitoring key to determine misalignment between blind and reticle
摘要 A reticle including exposure monitoring keys. The reticle includes an exposure region that is to be exposed to light during an exposure process, and a non-exposure region surrounding the exposure region and not to be exposed to the light. The exposure monitoring keys are disposed across a boundary between the exposure region and the non-exposure region.
申请公布号 US8977990(B2) 申请公布日期 2015.03.10
申请号 US201313856164 申请日期 2013.04.03
申请人 Samsung Display Co., Ltd. 发明人 An Young-Sik
分类号 G06F17/50;G03F1/22 主分类号 G06F17/50
代理机构 代理人 Bushnell, Esq. Robert E.
主权项 1. A reticle, comprising: an exposure region that is to be exposed to light during an exposure process; a non-exposure region surrounding the exposure region and not to be exposed to the light during the exposure process; and exposure monitoring keys disposed across a boundary between the exposure region and the non-exposure region, the exposure region comprising a pattern region in which target patterns are disposed, one part of each of the exposure monitoring keys disposed in the exposure region from out of the pattern region, and another part of the each exposure monitoring key disposed in the non-exposure region.
地址 Giheung-Gu, Yongin, Gyeonggi-Do KR