发明名称 SEMICONDUCTOR DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To solve the problems that the number of oxide semiconductor layers is increased by a parallel connection of a first transistor and a second transistor, and parasitic capacitance influences operation of a transistor.SOLUTION: An oxide semiconductor layer has a first channel formation region and a second channel formation region. A source electrode and a drain electrode are located above the oxide semiconductor layer. An insulating layer is located above the source electrode and the drain electrode. A gate electrode is located above the insulating layer. The gate electrode has an opening. The opening is overlapped with the source electrode or the drain electrode.</p>
申请公布号 JP2015043416(A) 申请公布日期 2015.03.05
申请号 JP20140149998 申请日期 2014.07.23
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 MATSUKURA HIDEKI
分类号 H01L29/786;H01L21/28;H01L21/8234;H01L27/088 主分类号 H01L29/786
代理机构 代理人
主权项
地址