发明名称 ION-SENSITIVE LAYER STRUCTURE FOR AN ION-SENSITIVE SENSOR AND METHOD FOR MANUFACTURING SAME
摘要 In a method for manufacturing an ion-sensitive structure for an ion-sensitive sensor, first a semiconductor substrate bearing an oxide layer is provided, whereupon a metal oxide layer and a metal layer are deposited and tempered, in order to obtain a layer sequence having a crystallized metal oxide layer and an oxidized and crystallized metal layer on the semiconductor substrate bearing the oxide layer. In such case, the metal oxide layer and the metal layer have a compatible metal element, and the coating thickness dMOX of the metal oxide layer is greater than the coating thickness dMET of the metal layer.
申请公布号 US2015060953(A1) 申请公布日期 2015.03.05
申请号 US201414464268 申请日期 2014.08.20
申请人 Endress + Hauser Conducta Gesellschaft für Mess- und Regeltechnik mbH + Co. KG 发明人 Kunath Christian;Kurth Eberhard;Pechstein Torsten
分类号 G01N27/414;H01L21/28 主分类号 G01N27/414
代理机构 代理人
主权项
地址 Gerlingen DE