发明名称 METHOD FOR FORMING SIOCH FILM USING ORGANOAMINOSILANE ANNEALING
摘要 <p>The present invention relates to a method for forming a low dielectric SiOCH film modified on a substrate which comprises the steps of: providing a low dielectric SiOCH film formed on a substrate by fluidity of CVD; increasing Si-O bonds and/or Si-C bonds on a SiOCH film by exposing the low dielectric SiOCH film to gas containing Si-N bonds within a molecule as electromagnetic energy is not applied; and hardening the low dielectric SiOCH film.</p>
申请公布号 KR20150022677(A) 申请公布日期 2015.03.04
申请号 KR20140105478 申请日期 2014.08.13
申请人 ASM IP HOLDING B.V. 发明人 ISHIKAWA DAI;MATSUSHITA KIYOHIRO;NAKANO AKINORI;UEDA SHINTARO;ARAI HIROFUMI
分类号 H01L21/312;H01L21/205 主分类号 H01L21/312
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