发明名称 |
Systems and methods for enhanced media defect detection |
摘要 |
Various embodiments of the present invention provide systems and methods for media defect detection. |
申请公布号 |
US8972800(B2) |
申请公布日期 |
2015.03.03 |
申请号 |
US201213561243 |
申请日期 |
2012.07.30 |
申请人 |
LSI Corporation |
发明人 |
Zhang Fan;Tan Weijun;Jin Ming;Xia Haitao |
分类号 |
G06F11/07 |
主分类号 |
G06F11/07 |
代理机构 |
Hamilton DeSanctis & Cha |
代理人 |
Hamilton DeSanctis & Cha |
主权项 |
1. A data processing system, the data processing system comprising:
a multi-pass defect detector circuit including: a defect quality characterization circuit operable to determine a defect amplitude based upon two or more accesses of a data set from a location on a medium identified as potentially defective; and a threshold comparison circuit operable to compare the defect amplitude with a threshold value to yield a defect indication. |
地址 |
San Jose CA US |