发明名称 Systems and methods for enhanced media defect detection
摘要 Various embodiments of the present invention provide systems and methods for media defect detection.
申请公布号 US8972800(B2) 申请公布日期 2015.03.03
申请号 US201213561243 申请日期 2012.07.30
申请人 LSI Corporation 发明人 Zhang Fan;Tan Weijun;Jin Ming;Xia Haitao
分类号 G06F11/07 主分类号 G06F11/07
代理机构 Hamilton DeSanctis & Cha 代理人 Hamilton DeSanctis & Cha
主权项 1. A data processing system, the data processing system comprising: a multi-pass defect detector circuit including: a defect quality characterization circuit operable to determine a defect amplitude based upon two or more accesses of a data set from a location on a medium identified as potentially defective; and a threshold comparison circuit operable to compare the defect amplitude with a threshold value to yield a defect indication.
地址 San Jose CA US
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