发明名称 |
SILICON WAFER HEAT TREATMENT METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a silicon wafer heat treatment method which can prevent carbon contamination from a jig and an environment during a heat treatment process.SOLUTION: A silicon wafer heat treatment method comprises: a process of putting a silicon wafer into a heat treat furnace by mounting the silicon wafer on an SiC jig; a process of heat treating the silicon wafer in the heat treatment furnace under a first non-oxidizing atmosphere; a process of decreasing a temperature of the silicon wafer to a temperature capable of carrying the silicon wafer out of the heat treatment furnace; and a process of carrying the silicon wafer out of the heat treatment furnace. In the temperature decreasing process, the first non-oxidizing atmosphere is switched to an oxygen-containing atmosphere after decreasing a temperature to a temperature capable of carrying the silicon wafer out, and an oxide film of a thickness of 1-10 nm is formed on a surface of the SiC jig under the oxygen-containing atmosphere, and subsequently the oxygen-containing atmosphere is switched to a second non-oxidizing atmosphere. |
申请公布号 |
JP2015041738(A) |
申请公布日期 |
2015.03.02 |
申请号 |
JP20130173248 |
申请日期 |
2013.08.23 |
申请人 |
SHIN ETSU HANDOTAI CO LTD |
发明人 |
MAGARI TAKEMINE;TAWARA FUMIO |
分类号 |
H01L21/324;C30B29/06;C30B33/02 |
主分类号 |
H01L21/324 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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