发明名称 SILICON WAFER HEAT TREATMENT METHOD
摘要 PROBLEM TO BE SOLVED: To provide a silicon wafer heat treatment method which can prevent carbon contamination from a jig and an environment during a heat treatment process.SOLUTION: A silicon wafer heat treatment method comprises: a process of putting a silicon wafer into a heat treat furnace by mounting the silicon wafer on an SiC jig; a process of heat treating the silicon wafer in the heat treatment furnace under a first non-oxidizing atmosphere; a process of decreasing a temperature of the silicon wafer to a temperature capable of carrying the silicon wafer out of the heat treatment furnace; and a process of carrying the silicon wafer out of the heat treatment furnace. In the temperature decreasing process, the first non-oxidizing atmosphere is switched to an oxygen-containing atmosphere after decreasing a temperature to a temperature capable of carrying the silicon wafer out, and an oxide film of a thickness of 1-10 nm is formed on a surface of the SiC jig under the oxygen-containing atmosphere, and subsequently the oxygen-containing atmosphere is switched to a second non-oxidizing atmosphere.
申请公布号 JP2015041738(A) 申请公布日期 2015.03.02
申请号 JP20130173248 申请日期 2013.08.23
申请人 SHIN ETSU HANDOTAI CO LTD 发明人 MAGARI TAKEMINE;TAWARA FUMIO
分类号 H01L21/324;C30B29/06;C30B33/02 主分类号 H01L21/324
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