发明名称 |
METHOD FOR MANUFACTURING GROUP III NITRIDE FILM AND METHOD FOR MANUFACTURING GROUP III NITRIDE SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for manufacturing a group III nitride film having high quality and a method for manufacturing a group III nitride semiconductor device using the same and having an excellent yield and high properties.SOLUTION: A method for manufacturing a group III nitride film 30 comprises the steps of: forming an interlayer 20 including a photothermal conversion layer 22 on a group III nitride substrate 10 and having an opening 20w; forming a group III nitride film 30 on the interlayer 20 having the opening 20w and on the group III nitride substrate 10 in the opening 20w of the interlayer 20; and separating the group III nitride film 30 from the group III nitride substrate 10 by emitting light having a wavelength longer than that corresponding to the lowest bandgap energy out of bandgap energies of the group III nitride substrate 10 and the group III nitride film 30 and a wavelength to be absorbed by the photothermal conversion layer 22. |
申请公布号 |
JP2015040136(A) |
申请公布日期 |
2015.03.02 |
申请号 |
JP20130170406 |
申请日期 |
2013.08.20 |
申请人 |
SUMITOMO ELECTRIC IND LTD |
发明人 |
UEMATSU KOJI;ISHIHARA KUNIAKI;TAKAGI SHIMPEI;YAMAMOTO YOSHIYUKI |
分类号 |
C30B29/38;C23C16/34;H01L21/20;H01L21/205;H01L21/28;H01L21/329;H01L29/47;H01L29/861;H01L29/868;H01L29/872;H01L33/32 |
主分类号 |
C30B29/38 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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