Substrate Defect Detection Mechanism

摘要

A method is disclosed. The method includes one or more light field cameras recording image data of a substrate during printing to the substrate and a control unit processing the image data received from the one or more light field cameras to identify defect areas in the substrate.

主权项

1. A print system comprising:
a printhead array to apply printed characters to a substrate; a first light field camera to record first image data at a first section of the substrate during application of presentation content to the substrate; a second light field camera to record second image data at a second section of the substrate during application of presentation content to the substrate and a control unit to process the first and second image data to map out a surface of the substrate using the first image data to determine a first focal length at the first section of the substrate and the second image data to determine a second focal length at the second section of the substrate to generate a three-dimensional surface of the substrate to identify defect areas in the substrate.