发明名称 半導体装置
摘要 <p>A semiconductor device according to an embodiment includes: a first transistor including a gate connected to a first interconnection, a first source, and a first drain, one of the first source and the first drain being connected to a second interconnection; and a second transistor including a gate structure, a second source, and a second drain, one of the second source and second drain being connected to a third interconnection and the other of the second source and second drain being connected to a fourth interconnection. The gate structure includes a gate insulation film, a gate electrode, and a threshold-modulating film provided between the gate insulation film and the gate electrode to modulate a threshold voltage, the other of the first source and first drain of the first transistor is connected to the gate electrode.</p>
申请公布号 JP5677254(B2) 申请公布日期 2015.02.25
申请号 JP20110209688 申请日期 2011.09.26
申请人 发明人
分类号 H01L21/8242;G11C11/405;H01L21/283;H01L21/336;H01L21/8246;H01L21/8247;H01L27/10;H01L27/105;H01L27/108;H01L27/115;H01L29/423;H01L29/49;H01L29/788;H01L29/792 主分类号 H01L21/8242
代理机构 代理人
主权项
地址