发明名称 |
Integrated circuits with improved spacers and methods for fabricating same |
摘要 |
Integrated circuits and methods for fabricating integrated circuits are provided. In an embodiment, a method for fabricating an integrated circuit includes simultaneously shielding a shielded region of a semiconductor substrate and exposing a surface of the shielded region of the semiconductor substrate. An ion implantation is performed to form implant areas in a non-shielded region of the semiconductor substrate adjacent the shielded region. Also, the semiconductor substrate is silicided to form a silicided area in the shielded region of the semiconductor substrate. |
申请公布号 |
US8962429(B2) |
申请公布日期 |
2015.02.24 |
申请号 |
US201213572343 |
申请日期 |
2012.08.10 |
申请人 |
GLOBALFOUNDRIES, Inc. |
发明人 |
Flachowsky Stefan;Hoentschel Jan |
分类号 |
H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
Ingrassia Fisher & Lorenz, P.C. |
代理人 |
Ingrassia Fisher & Lorenz, P.C. |
主权项 |
1. A method for fabricating an integrated circuit comprising:
simultaneously shielding a shielded region of a semiconductor substrate and exposing a surface of the shielded region of the semiconductor substrate by forming a spacer over the semiconductor substrate, wherein the spacer has an outer surface defining a maximum thickness at an elevated section and a reduced thickness at a base section; performing an ion implantation to form implant areas in a non-shielded region of the semiconductor substrate adjacent the shielded region; and siliciding the semiconductor substrate to form a silicided area in the shielded region of the semiconductor substrate. |
地址 |
Grand Cayman KY |