发明名称 Integrated circuits with improved spacers and methods for fabricating same
摘要 Integrated circuits and methods for fabricating integrated circuits are provided. In an embodiment, a method for fabricating an integrated circuit includes simultaneously shielding a shielded region of a semiconductor substrate and exposing a surface of the shielded region of the semiconductor substrate. An ion implantation is performed to form implant areas in a non-shielded region of the semiconductor substrate adjacent the shielded region. Also, the semiconductor substrate is silicided to form a silicided area in the shielded region of the semiconductor substrate.
申请公布号 US8962429(B2) 申请公布日期 2015.02.24
申请号 US201213572343 申请日期 2012.08.10
申请人 GLOBALFOUNDRIES, Inc. 发明人 Flachowsky Stefan;Hoentschel Jan
分类号 H01L21/336 主分类号 H01L21/336
代理机构 Ingrassia Fisher & Lorenz, P.C. 代理人 Ingrassia Fisher & Lorenz, P.C.
主权项 1. A method for fabricating an integrated circuit comprising: simultaneously shielding a shielded region of a semiconductor substrate and exposing a surface of the shielded region of the semiconductor substrate by forming a spacer over the semiconductor substrate, wherein the spacer has an outer surface defining a maximum thickness at an elevated section and a reduced thickness at a base section; performing an ion implantation to form implant areas in a non-shielded region of the semiconductor substrate adjacent the shielded region; and siliciding the semiconductor substrate to form a silicided area in the shielded region of the semiconductor substrate.
地址 Grand Cayman KY