| 发明名称 |
PROBE CARD FOR AN APPARATUS FOR TESTING ELECTRONIC DEVICES |
| 摘要 |
A probe card for an apparatus for testing electronic devices comprises at least one probe head, a plurality of contact probes housed within the probe head, each contact probe having at least one contact tip suitable to abut against contact pads of a device to be tested, a supporting plate of the probe head, an interface plate, a stiffener associating the supporting plate and the interface plate, a plurality of connecting elements with clearance disposed between the supporting plate and the interface plate and housed in a floating manner in a plurality of respective seats made in the supporting plate, and a plurality of connecting elements without clearance disposed between the interface plate and the stiffener. |
| 申请公布号 |
US2015048856(A1) |
申请公布日期 |
2015.02.19 |
| 申请号 |
US201414528774 |
申请日期 |
2014.10.30 |
| 申请人 |
Technoprobe S.p.A. |
发明人 |
Vettori Riccardo;Liberini Riccardo |
| 分类号 |
G01R1/073;G01R1/067 |
主分类号 |
G01R1/073 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A probe card for a testing apparatus for testing electronic devices, comprising:
a probe head, a plurality of contact probes housed within the probe head, each contact probe having at least one contact tip suitable to abut against a contact pad of a device to be tested, a supporting plate configured to support the probe head, an interface plate, a stiffener associated with the supporting plate and the interface plate, a plurality of connecting elements with clearance disposed between the supporting plate and the interface plate and housed in a floating manner in a plurality of respective seats made in the supporting plate, and a plurality of connecting elements without clearance disposed between the interface plate and the stiffener. |
| 地址 |
Cernusco Lombardone IT |
