SEMICONDUCTOR TESTING JIG

摘要

PROBLEM TO BE SOLVED: To obtain a semiconductor testing jig capable of improving workability at a time of testing a plurality of vertical semiconductor devices, shortening testing time, and easily dealing with various sizes of semiconductor devices.SOLUTION: A semiconductor testing jig is used to test a plurality of vertical semiconductor devices 5 each including a lower surface electrode 3 and an upper surface electrode 4. A conductive base 1 includes a plurality of installation portions 6 in which the vertical semiconductor devices 5 are individually installed in a state in which the lower surface electrodes 3 contact the installation portions 6. A lattice insulating frame 2 is provided on the base 1 for surrounding the installation portions 6. The frame 2 is replaceable depending on sizes of the vertical semiconductor devices 5 to be installed.