发明名称 スクラップ表面プロファイル計測方法
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a scrap surface profile measurement method which properly measures a distance to the scrap surface stacked in a container to measure the surface profile of scrap in the container with high accuracy. <P>SOLUTION: An electromagnetic wave distance measurement part 11 transmits electromagnetic waves with a beam width adjusted so as to radiate the spot nearly equal to or under the size of large scrap 21 of the scrap 21 in a container 2 onto the scrap 21 surface in the container 2, from an antenna 111 and receives the reflection waves with the antenna 111, thereby measuring a distance to the scrap 21 surface in the container 2. <P>COPYRIGHT: (C)2012,JPO&INPIT</p>
申请公布号 JP5673092(B2) 申请公布日期 2015.02.18
申请号 JP20100290669 申请日期 2010.12.27
申请人 发明人
分类号 G01S7/295;G01S13/08 主分类号 G01S7/295
代理机构 代理人
主权项
地址