发明名称 |
p-TYPE ZnO-BASED SEMICONDUCTOR LAYER MANUFACTURING METHOD AND ZnO-BASED SEMICONDUCTOR ELEMENT MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of manufacturing a p-type ZnO-based semiconductor layer having a high acceptor concentration.SOLUTION: A p-type ZnO-based semiconductor layer manufacturing method comprises: (a) forming an n-type ZnO-based semiconductor single crystal structure including a group IB element which is Cu or/and Ag and one and more group IIIB elements selected from a group consisting of B, Ga, Al and In; (b) performing first annealing on the n-type ZnO-based semiconductor single crystal structure under reduced pressure; and (c) performing second annealing on the n-type ZnO-based semiconductor singe crystal structure having been subjected to first annealing in an oxidant-containing atmosphere to form a p-type ZnO-based semiconductor layer in which the group IB element and the group IIIB element are co-doped. |
申请公布号 |
JP2015032680(A) |
申请公布日期 |
2015.02.16 |
申请号 |
JP20130160955 |
申请日期 |
2013.08.02 |
申请人 |
STANLEY ELECTRIC CO LTD |
发明人 |
SANO MICHIHIRO;SAITO SENJU;KATO HIROYUKI |
分类号 |
H01L33/28;H01L21/20;H01L21/363 |
主分类号 |
H01L33/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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