发明名称 TUNNELING FIELD EFFECT TRANSISTORS (TFETS) FOR CMOS ARCHITECTURES AND APPROACHES TO FABRICATING N-TYPE AND P-TYPE TFETS
摘要 Tunneling field effect transistors (TFETs) for CMOS architectures and approaches to fabricating N-type and P-type TFETs are described. For example, a tunneling field effect transistor (TFET) includes a homojunction active region disposed above a substrate. The homojunction active region includes a relaxed Ge or GeSn body having an undoped channel region therein. The homojunction active region also includes doped source and drain regions disposed in the relaxed Ge or GeSn body, on either side of the channel region. The TFET also includes a gate stack disposed on the channel region, between the source and drain regions. The gate stack includes a gate dielectric portion and gate electrode portion.
申请公布号 US2015041847(A1) 申请公布日期 2015.02.12
申请号 US201414521200 申请日期 2014.10.22
申请人 Kotlyar Roza;Cea Stephen M.;Dewey Gilbert;Chu-Kung Benjamin;Avci Uygar E.;Rios Rafael;Chaudhry Anurag;Linton, JR. Thomas D.;Young Ian A.;Kuhn Kelin J. 发明人 Kotlyar Roza;Cea Stephen M.;Dewey Gilbert;Chu-Kung Benjamin;Avci Uygar E.;Rios Rafael;Chaudhry Anurag;Linton, JR. Thomas D.;Young Ian A.;Kuhn Kelin J.
分类号 H01L29/78;H01L29/267;H01L29/06;H01L29/24;H01L29/16 主分类号 H01L29/78
代理机构 代理人
主权项 1. A tunneling field effect transistor (TFET), comprising: a homojunction active region disposed above a relaxed substrate, the homojunction active region comprising: a biaxially tensile strained Ge or Ge1-ySny body having an undoped channel region therein; anddoped source and drain regions disposed in the biaxially tensile strained Ge or Ge1-ySny body, on either side of the channel region; and a gate stack disposed on the channel region, between the source and drain regions, the gate stack comprising a gate dielectric portion and gate electrode portion.
地址 Portland OR US