发明名称 APPARATUS AND METHOD FOR TRACKING DEFECTS IN SHEET MATERIALS
摘要 The invention relates to a method for marking a material defect in a sheet material. In order to provide a method that can be used to identify a material defect in a sheet material particularly accurately, reliably and permanently, provision is made for a material defect in a moving sheet material to be sensed by a defect sensor and for a surface structure feature in the region of the sensed material defect to be sensed by a first marking sensor (4a) and for a first structure data record representing the surface structure feature to be ascertained and stored.
申请公布号 WO2015018759(A1) 申请公布日期 2015.02.12
申请号 WO2014EP66630 申请日期 2014.08.01
申请人 KHS GMBH 发明人 HERRMANN, JÜRGEN-PETER;HERRMANN, MARIUS MICHAEL;SCHORN, WOLFGANG
分类号 B65H26/06;B65H26/02 主分类号 B65H26/06
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