发明名称 Semiconductor device and method for manufacturing the same
摘要 A semiconductor device includes: an integrated circuit having an electrode pad; a first insulating layer disposed on the integrated circuit; a redistribution layer including a plurality of wirings and disposed on the first insulating layer, at least one of the plurality of wirings being electrically coupled to the electrode pad; a second insulating layer having a opening on at least a portion of the plurality of wirings; a metal film disposed on the opening and on the second insulating layer, and electrically coupled to at least one of the plurality of wirings; and a solder bump the solder bump overhanging at least one of the plurality of wirings not electrically coupled to the metal film.
申请公布号 US8952538(B2) 申请公布日期 2015.02.10
申请号 US201012975961 申请日期 2010.12.22
申请人 Fujitsu Semiconductor Limited 发明人 Matsuki Hirohisa
分类号 H01L23/48;H01L23/52;H01L23/40;H01L23/00 主分类号 H01L23/48
代理机构 Westerman, Hattori, Daniels & Adrian, LLP 代理人 Westerman, Hattori, Daniels & Adrian, LLP
主权项 1. A semiconductor device comprising: a semiconductor substrate; an electrode pad disposed on the semiconductor substrate; a first insulating layer disposed on the electrode pad and the semiconductor substrate; the first insulating layer having a first opening directly over the electrode pad; first wiring disposed on the first insulating layer, the first wiring being directly coupled to the electrode pad through a conductor via formed in the first opening; a second wiring disposed on the first insulating layer, the second wiring is disposed perpendicularly to the first wiring; a second insulating layer disposed on the first wiring, the second wiring and the first insulating layer, the second insulating layer having a second opening overlying a portion of the first wiring; a metal film disposed on the first wiring in the second opening and on a part of the second insulating layer; and a solder bump overlying the metal film, wherein the second wire passes through under the metal film.
地址 Yokohama JP