发明名称 GLARE MEASURING SYSTEM
摘要 A glare measuring system is configured to have an imaging camera which is supported to be rotatable within a horizontal plane, and a processing device which calculates equivalent veiling luminance on the basis of a pickup image of the imaging camera and calculates the value of a glare rating GR on the basis of the equivalent veiling luminance. The imaging camera has a super-wide-angle lens mounted thereon, and picks up an image in a position which is rotated within the horizontal plane by every angle corresponding to the angle of view α of the super-wide-angle. The processing device combines pickup images to generate a composite image in which a glare measurement direction is set to the center of the composite image, calculates equivalent veiling luminance on the basis of the composite image, and calculates the value of the glare rating in the glare measurement direction.
申请公布号 US2015035972(A1) 申请公布日期 2015.02.05
申请号 US201314384959 申请日期 2013.02.25
申请人 IWASAKI ELECTRIC CO., LTD. 发明人 Yamada Tetsuji;Oshima Kosuke
分类号 G01J1/42;H04N5/225;H04N5/265 主分类号 G01J1/42
代理机构 代理人
主权项 1. A glare measuring system comprising: an imaging device that is supported to be rotatable within a flat plane; and a processing device that calculates equivalent veiling luminance on the basis of an image picked up by the imaging device and calculates a value of glare on the basis of the equivalent veiling luminance, wherein the imaging device has a wide-angle lens mounted thereon and picks up the image through the wide-angle lens in a position that is rotated within the flat plane at intervals of an angle corresponding to an angle of view of the wide-angle lens, thereby imaging all directions within the flat plane, and the processing device converts each of the pickup images containing a glare measurement direction set within the flat plane to an image in which the glare measurement direction is set to an imaging direction, and combines converted images to generate an image in which the glare measurement direction is set to a center of the image, calculates equivalent veiling luminance on the basis of the image and calculates a value of glare in the glare measurement direction on the basis of the equivalent veiling luminance.
地址 Tokyo JP
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