发明名称 |
PATTERN FORMATION METHOD AND SURFACE TREATMENT AGENT USED THEREIN, METHOD FOR PRODUCING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE |
摘要 |
Provided is a pattern formation method with which a pattern having excellent flatness of a pattern top part and pattern durability with double development can be formed, the method comprising, in succession, the following: (1) a step for forming an actinic ray-sensitive or radiation-sensitive film from an actinic ray-sensitive or radiation-sensitive resin composition containing a resin that produces polar groups when decomposed by exposure to acid; (2) a step for exposing the actinic ray-sensitive or radiation-sensitive film; (4A) a step for exposing the actinic ray-sensitive or radiation-sensitive film to a surface treatment agent containing a compound that interacts with the polar groups contained in the resin after exposure; and (5A) a step for developing the actinic ray-sensitive or radiation-sensitive film using a developing solution containing an organic solvent. Also provided is a surface treatment agent used in the pattern formation method, a method for producing an electronic device, and an electronic device. |
申请公布号 |
WO2015016089(A1) |
申请公布日期 |
2015.02.05 |
申请号 |
WO2014JP69211 |
申请日期 |
2014.07.18 |
申请人 |
FUJIFILM CORPORATION |
发明人 |
ENOMOTO YUICHIRO;UEBA RYOSUKE;SHIRAKAWA MICHIHIRO;FURUTANI HAJIME;GOTO AKIYOSHI;KOJIMA MASAFUMI |
分类号 |
G03F7/38;G03F7/038;G03F7/039;G03F7/32;G03F7/40;H01L21/027 |
主分类号 |
G03F7/38 |
代理机构 |
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代理人 |
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