发明名称 OXIDE SINTERED BODY, SPUTTERING TARGET AND METHOD FOR PRODUCING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a high quality and high yield IGZO sputtering target optimal for an oxide semiconductor film use by improving variation in properties of an IGZO thin film and improving generation of cracks during target manufacturing and sputtering which are problems especially for a large-sized sputtering target for oxide semiconductor film.SOLUTION: An oxide sintered body contains at least In, Ga and Zn, and has a homologous crystal structure represented by InGaZnOand an open porosity of 0.2% or less.
申请公布号 JP2015024944(A) 申请公布日期 2015.02.05
申请号 JP20130232447 申请日期 2013.11.08
申请人 TOSOH CORP 发明人 ONOMI KENJI;HARA SHINICHI;KOGO MASANORI;ITO KENICHI;SHIBUTAMI TETSUO
分类号 C04B35/00;C04B35/453;C23C14/34 主分类号 C04B35/00
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