| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a high-speed tester communication interface between a test slice and a tray.SOLUTION: A tester system is disclosed. The tester system includes a tester module capable of operating so as to generate a test signal for testing multiple DUT (Devices Under Test). The tester system includes multiple cables capable of operating so as to communicatively connect the tester module with a tray including the multiple DUT (Devices Under Test) via an interface of a thermal chamber wall. Further, the tester system includes multiple connectors in contact with the tray. The multiple connectors are able to operate so as to give an interface between the multiple cables and a conductive trace on the tray. Further, each of the multiple connectors is able to operate so as to convey each sub-set of the test signal to each DUT on the tray by the conductive trace.</p> |
