发明名称 SUBSTRATE SUPPORT WITH SURFACE FEATURE FOR REDUCED REFLECTION AND MANUFACTURING TECHNIQUES FOR PRODUCING SAME
摘要 <p>Methods and apparatus are provided for reducing the thermal signal noise in process chambers using a non-contact temperature sensing device to measure the temperature of a component in the process chamber. In some embodiments, a susceptor for supporting a substrate in a process chamber includes a first surface comprising a substrate support surface; and a second surface opposite the first surface, wherein a portion of the second surface comprises a feature to absorb incident radiant energy.</p>
申请公布号 WO2015017094(A1) 申请公布日期 2015.02.05
申请号 WO2014US45968 申请日期 2014.07.09
申请人 APPLIED MATERIALS, INC. 发明人 LAU, SHU-KWAN;RANISH, JOSEPH M.;BRILLHART, PAUL;SAMIR, MEHMET TUGRUL
分类号 H01L21/683 主分类号 H01L21/683
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