| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a radiation measurement device capable of easily checking soundness of itself in short time, and to especially provide the radiation measurement device capable of easily specifying, when an abnormality is generated in the radiation measurement device, in what channel the abnormality is generated in short time, and further finding a malfunction on the side of an ionization chamber without irradiation with a charged particle beam. <P>SOLUTION: In a radiation measurement device using an ionization chamber, the above problem is solved by being provided with a mechanism for modulating applied voltage to the ionization chamber, and a mechanism for measuring an electric charge to be generated from the ionization chamber during modulation of the applied voltage. <P>COPYRIGHT: (C)2012,JPO&INPIT</p> |
