发明名称 Methods for producing a tunnel field-effect transistor
摘要 A method for producing a tunnel field-effect transistor is disclosed. Connection regions of different doping types are produced by means of self-aligning implantation methods.
申请公布号 US8946037(B2) 申请公布日期 2015.02.03
申请号 US201313957277 申请日期 2013.08.01
申请人 Infineon Technologies AG 发明人 Kakoschke Ronald;Tews Helmut
分类号 H01L21/336;H01L29/66;H01L29/73;H01L21/28;H01L21/8234;H01L27/088;H01L29/78 主分类号 H01L21/336
代理机构 Slater & Matsil, L.L.P. 代理人 Slater & Matsil, L.L.P.
主权项 1. A method of forming an integrated circuit, the method comprising: forming an auxiliary layer over a substrate; forming at least one auxiliary region by patterning the auxiliary layer and removing material of the auxiliary layer; forming a first spacer element in a region in which material of the auxiliary layer has been removed; doping a first connection region having a first doping type of a transistor, the first spacer element and the auxiliary region serving as a mask; covering the first connection region with a covering material, wherein the covering material is a first insulating material; removing material of the auxiliary region; forming a second spacer element in a region in which material of the auxiliary region has been removed, wherein the second spacer element is a second insulating material; and doping a second connection region having a second doping type of the transistor, the first doping type being opposite the second doping type, the second spacer element and the covering material serving as a mask, wherein the first connection region and the second connection region form input/output nodes of a tunnel transistor.
地址 Neubiberg DE