发明名称 Power/ground layout for chips
摘要 Embodiments of the present disclosure provide a chip that comprises a base metal layer formed over a first semiconductor die and a first metal layer formed over the base metal layer. The first metal layer includes a plurality of islands configured to route at least one of (i) a ground signal or (ii) a power signal in the chip. The chip further comprises a second metal layer formed over the first metal layer. The second metal layer includes a plurality of islands configured to route at least one of (i) the ground signal or (ii) the power signal in the chip.
申请公布号 US8946890(B2) 申请公布日期 2015.02.03
申请号 US201113277140 申请日期 2011.10.19
申请人 Marvell World Trade Ltd. 发明人 Sutardja Sehat;Han Chung Chyung;Li Weidan;Yu Shuhua;Cheng Chuan-Cheng;Wu Albert
分类号 H01L23/498;H01L23/00;H01L23/522;H01L23/528;H01L25/065;H01L25/00;H01L23/31 主分类号 H01L23/498
代理机构 代理人
主权项 1. A chip comprising: a base metal layer formed over a first semiconductor die; a first metal layer that is separate from the base metal layer, the first metal layer having a plurality of islands individually surrounded along their entire periphery by a dielectric material, wherein the plurality of islands are configured to route at least one of (i) a ground signal or (ii) a power signal in the chip; and a second metal layer that is separate from the first metal layer, the second metal layer having a plurality of islands individually surrounded along their entire periphery by a passivation material, wherein the plurality of islands are configured to route at least one of (i) the ground signal or (ii) the power signal in the chip, wherein the plurality of islands of the first metal layer is configured to align with the plurality of islands of the second metal layer, and wherein at least some of the plurality of islands of the first metal layer are connected to at least some of the plurality of islands of the second metal layer by vias.
地址 St. Michael BB