发明名称 Methods for modeling tunable radio-frequency elements
摘要 A test system for characterizing an antenna tuning element is provided. The test system may include a test host, a radio-frequency tester, and a test fixture. The test system may calibrate the radio-frequency tester using known coaxial standards. The test system may then calibrate transmission line effects associated with the test fixture using a THRU-REFLECT-LINE calibration algorithm. The antenna tuning element may be mounted on a test socket that is part of the test fixture. While the antenna tuning element is mounted on the test socket, scattering parameter measurements may be obtained using the radio-frequency tester. An equivalent circuit model for the test socket can be obtained based on the measured scattering parameters and known characteristics of the antenna tuning element. Once the test socket has been characterized, an equivalent circuit model for the antenna tuning element can be obtained by extracting suitable modeling parameters from the measured scattering parameters.
申请公布号 US8947113(B2) 申请公布日期 2015.02.03
申请号 US201213466017 申请日期 2012.05.07
申请人 Apple Inc. 发明人 Han Liang;Nath Jayesh;Mow Matthew A.;Bevelacqua Peter;Nickel Joshua G.;Pascolini Mattia;Schlub Robert W.;Caballero Ruben
分类号 G01R31/00 主分类号 G01R31/00
代理机构 Treyz Law Group 代理人 Treyz Law Group ;Tsai Jason;Lyons Michael H.
主权项 1. A method for using a test system to test a device under test, wherein the test system includes a test fixture to which the device under test is attached during testing, the method comprising: calibrating the test fixture to remove systematic effects associated with the test fixture; when the systematic effects associated with the test fixture have been removed, characterizing the device under test, wherein the device under test comprises an antenna tuning element, wherein characterizing the device under test comprises characterizing the antenna tuning element, wherein the test system further includes a radio-frequency tester; while the device under test is attached to the test fixture, obtaining radio-frequency measurements from the device under test with the radio-frequency tester, wherein obtaining the radio-frequency measurements from the device under test comprises gathering scattering parameter data from the device under test.
地址 Cupertino CA US