发明名称 |
Semiconductor memory, memory system, and operation method thereof |
摘要 |
A memory system includes a semiconductor memory including a storage unit configured to store parameter information in response to a test mode signal and to output the stored parameter information in response to a parameter request signal, and a memory controller configured to provide the parameter request signal to the semiconductor memory and receive the parameter information from the semiconductor memory device. |
申请公布号 |
US8947955(B2) |
申请公布日期 |
2015.02.03 |
申请号 |
US201313844924 |
申请日期 |
2013.03.16 |
申请人 |
SK Hynix Inc. |
发明人 |
Byun Hee-Jin;Kwean Ki-Chang |
分类号 |
G11C7/00;G11C7/10;G11C29/02;G11C29/04;G11C29/44 |
主分类号 |
G11C7/00 |
代理机构 |
IP&T Group LLP |
代理人 |
IP&T Group LLP |
主权项 |
1. A memory system, comprising:
a semiconductor memory including a storage unit configured to store a parameter information in response to a test mode signal and to output the stored parameter information in response to a parameter request signal; and a memory controller configured to provide the parameter request signal to the semiconductor memory and receive the parameter information from the semiconductor memory device, wherein the parameter information corresponds to a skew between the data strobe signal and the system clock. |
地址 |
Gyeonggi-do KR |