| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To position a sample to be mounted, in particular on a thermal analyzer, in a simple and accurate way. <P>SOLUTION: An image covering a broad range is acquired of a mounted sample and part of testing equipment around the sample to evaluate the positioning while keeping the sample off contact, and processed to compare the relative position on the image by geometric analysis to determine whether or not the sample is properly positioned. If the positioning is found improper, the sample is repositioned and subjected to the same evaluating procedure. <P>COPYRIGHT: (C)2013,JPO&INPIT</p> |
