METHODS AND SYSTEMS TO MEASURE A SIGNAL ON AN INTEGRATED CIRCUIT DIE

摘要

Methods and systems to measure a signal on an integrated circuit die. An on-die measurement circuit may measure an on-die signal relative to an off-die generated reference signal, which may include a series of increasing voltage steps. The on-die measurement ent circuit may continuously compare voltages of the on-die signal and the off-die generated reference signal, and may generate an indication when the off-die reference signal exceeds the on-die signal. The measurement circuit may generate the indication from a voltage source other than the on-die signal to be measured, and/or may generate the indication with a relatively large voltage swing. The indication may be output off-die for evaluation, such as for testing, debugging, characterization, and/or operational monitoring. A unity gain analog buffer may be provided to tap the on-die signal proximate to a node of interest, which may be implemented within the on-die measurement circuit.

主权项

1. A processor comprising:
a first pad; a second pad; a measurement circuit having:
a first input node to receive a test signal;a second input node to receive a reference signal from the first pad; andan output node to provide an indication of a relation between the test signal and the reference signal to the second pad, wherein the measurement circuit is to protect the first input node from the second pad to preserve signal fidelity of the test signal.