发明名称 IMAGE INSPECTION METHOD AND INSPECTION REGION SETTING METHOD
摘要 An image inspection apparatus according to the present invention uses inspection region defining information including information defining an initial contour of an inspection region and information defining a range based on the initial contour as a search range for searching a contour of the inspection region. The contour of the inspection region is generated by setting a plurality of base points on the initial contour and performing edge search processing on a line that passes through each base point and intersects with the initial contour, within an area of the search range of the inspection target object image, to determine an edge point corresponding to each base point, and by connecting or approximating a plurality of the edge points thus obtained.
申请公布号 EP2827131(A1) 申请公布日期 2015.01.21
申请号 EP20120871208 申请日期 2012.11.16
申请人 OMRON CORPORATION 发明人 KOTAKE YASUYO;MINATO YOSHIHISA;YANAGAWA YUKIKO;NGUYEN ANH
分类号 G01N21/84;G01B11/00;G01N21/956;G06T7/60;H05K3/34;H05K13/08 主分类号 G01N21/84
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