发明名称 質量分析装置
摘要 <p>A spectrometer is offered which can reduce ion loss compared with the prior art even when ions selected by the mass analyzer are modified. The spectrometer includes an ion source (10) for ionizing a sample, an ion storage portion (20) for repeatedly performing a storing operation for storing ions created by the ion source (10) and an expelling operation for expelling the stored ions as pulsed ions, the mass analyzer (30) for passing pulsed ions expelled from the ion storage portion (20) and selecting desired ions according to their mass-to-charge ratio, a detector (60) for detecting pulsed ions passed through the mass analyzer (30) and outputting an analog signal responsive to the intensity of the detection, and a controller (90) for maintaining constant the mass-to-charge ratio of the desired ions selected by the mass analyzer (30) while pulsed ions including the desired ions are passing through the mass analyzer (30).</p>
申请公布号 JP5657278(B2) 申请公布日期 2015.01.21
申请号 JP20100119169 申请日期 2010.05.25
申请人 发明人
分类号 H01J49/42;G01N27/62 主分类号 H01J49/42
代理机构 代理人
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