发明名称 CLEANING METHOD AND PROCESSING DEVICE
摘要 PROBLEM TO BE SOLVED: To effectively clean a processing device while using a gas supply mechanism capable of performing shunt control.SOLUTION: A cleaning method including a gas supply mechanism for cleaning a processing device is disclosed. The gas supply mechanism includes: a shunt control part; a first channel communicating to an upstream side of the shunt control part; a first valve provided in the first channel; a second channel communicating to a downstream side of the shunt control part; a second valve provided in the second channel; and a bypass valve provided in a detour channel connecting the first channel and the second channel and connected to the second channel. The cleaning method includes: a bypass opening step of closing the first valve and the second valve and opening the bypass valve; and a cleaning step of introducing gas from the detour channel to the processing device after the bypass opening step, and cleaning the processing device.
申请公布号 JP2015012141(A) 申请公布日期 2015.01.19
申请号 JP20130136577 申请日期 2013.06.28
申请人 TOKYO ELECTRON LTD 发明人 TAKAHASHI EIJI;SASAKI NORIKAZU;SAWACHI JUN
分类号 H01L21/3065;C23C16/44;H01L21/205 主分类号 H01L21/3065
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