发明名称 |
CLEANING METHOD AND PROCESSING DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To effectively clean a processing device while using a gas supply mechanism capable of performing shunt control.SOLUTION: A cleaning method including a gas supply mechanism for cleaning a processing device is disclosed. The gas supply mechanism includes: a shunt control part; a first channel communicating to an upstream side of the shunt control part; a first valve provided in the first channel; a second channel communicating to a downstream side of the shunt control part; a second valve provided in the second channel; and a bypass valve provided in a detour channel connecting the first channel and the second channel and connected to the second channel. The cleaning method includes: a bypass opening step of closing the first valve and the second valve and opening the bypass valve; and a cleaning step of introducing gas from the detour channel to the processing device after the bypass opening step, and cleaning the processing device. |
申请公布号 |
JP2015012141(A) |
申请公布日期 |
2015.01.19 |
申请号 |
JP20130136577 |
申请日期 |
2013.06.28 |
申请人 |
TOKYO ELECTRON LTD |
发明人 |
TAKAHASHI EIJI;SASAKI NORIKAZU;SAWACHI JUN |
分类号 |
H01L21/3065;C23C16/44;H01L21/205 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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