发明名称 MICROORGANISM SAMPLE OBSERVATION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a method of easily observing a microorganism sample without complex pretreatment.SOLUTION: An environmental control scanning electron microscope having a schottky-type electron gun is used, to observe a microorganism sample, under the following conditions: under a saturated vapor pressure, in a temperature range of 0°C-5°C, with an acceleration voltage of 2 kV or more and 5 kV or less, and with an operation distance of 5 mm or more and 8 mm or less.
申请公布号 JP2015008634(A) 申请公布日期 2015.01.19
申请号 JP20130133893 申请日期 2013.06.26
申请人 JFE STEEL CORP 发明人 HAMADA ETSUO;YAMADA KATSUMI
分类号 C12Q1/04 主分类号 C12Q1/04
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