发明名称 SAMPLE HOLDER AND CHARGED PARTICLE DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide a sample holder which is enhanced in support rigidity in the direction of a second axis of a sample block in order to reduce oscillation in the direction of the second axis of the sample block.SOLUTION: Disclosed is a sample holder having a sample block for holding a sample and a frame body for supporting the sample block with a rotary shaft. An elastic body is arranged between the frame body and the sample block and the sample block is pressed with respect to the frame body.</p>
申请公布号 JP2015008050(A) 申请公布日期 2015.01.15
申请号 JP20130132218 申请日期 2013.06.25
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 YAHATA KIYOSHI;MARUYAMA NAOTOMO;KIKUCHI HIDEKI
分类号 H01J37/20 主分类号 H01J37/20
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