发明名称 |
SAMPLE HOLDER AND CHARGED PARTICLE DEVICE |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a sample holder which is enhanced in support rigidity in the direction of a second axis of a sample block in order to reduce oscillation in the direction of the second axis of the sample block.SOLUTION: Disclosed is a sample holder having a sample block for holding a sample and a frame body for supporting the sample block with a rotary shaft. An elastic body is arranged between the frame body and the sample block and the sample block is pressed with respect to the frame body.</p> |
申请公布号 |
JP2015008050(A) |
申请公布日期 |
2015.01.15 |
申请号 |
JP20130132218 |
申请日期 |
2013.06.25 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORP |
发明人 |
YAHATA KIYOSHI;MARUYAMA NAOTOMO;KIKUCHI HIDEKI |
分类号 |
H01J37/20 |
主分类号 |
H01J37/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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