发明名称 Nonvolatile memory device, method of operating the same and electronic device including the same
摘要 A nonvolatile memory device and a method of operating the same are provided. The method includes performing a plurality of program operations on a plurality of memory cells each to be programmed to one of a plurality of program states, performing a program-verify operation on programmed memory cells associated with each of the plurality of program states, the program-verify operation comprises, selecting one of the plurality of offsets based on a noise level of a common source line associated with a programmed memory cell, using the selected offset to select one of a first verify voltage and a second verify voltage higher than the first verify voltage, and verifying a program state of the programmed memory cell using the first verify voltage and the second verify voltage.
申请公布号 US8934305(B2) 申请公布日期 2015.01.13
申请号 US201213479467 申请日期 2012.05.24
申请人 Samsung Electronics Co., Ltd. 发明人 Park Jae-Woo;Im Jung-No
分类号 G11C16/34;G11C16/06;G11C16/10;G11C11/56;G11C16/04 主分类号 G11C16/34
代理机构 Muir Patent Consulting, PLLC 代理人 Muir Patent Consulting, PLLC
主权项 1. A method of operating a nonvolatile memory device, the method comprising: performing a plurality of program operations on a plurality of memory cells each to be programmed to one of a plurality of program states; performing a program-verify operation on programmed memory cells of the plurality of memory cells, the programmed memory cells associated with each of the plurality of program states, wherein the program-verify operation comprises; selecting one of a plurality of offsets based on a noise level of a common source line associated with a programmed memory cell of the programmed memory cells;using the selected offset to select one of a first verify voltage and a second verify voltage higher than the first verify voltage; andverifying a program state of the programmed memory cell using the first verify voltage and the second verify voltage,wherein the selected offset is a difference between the first verify voltage and the second verify voltage, and wherein a selected offset has an increased value as the number of program operations performed on the memory cells increases.
地址 Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do KR
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