发明名称 IONIZATION WITH FEMTOSECOND LASERS AT ELEVATED PRESSURE
摘要 The present disclosure generally provides ionization methods and devices for use in mass spectrometry. In some embodiments, the ionization methods and devices employ short laser pulses (e.g., pulses having pulsewidths in a range of about 2 fs to about 1 ps) at a high intensity (e.g., an intensity in a range of about 1 TW/cm2 to about 1000 TW/cm2) to ionize an analyte an ambient pressure greater than about 10−5 Torr (e.g., an ambient pressure in a range of about 1 atmosphere to about 100 atmospheres).
申请公布号 US2015008313(A1) 申请公布日期 2015.01.08
申请号 US201214368686 申请日期 2012.12.04
申请人 DH Technologies Development Pte. Ltd. ;National Research Council of Canada 发明人 Loboda Alexandre V.;Corkum Paul;Rayner David
分类号 H01J49/14;H01J49/00;H01J49/04;H01J49/26 主分类号 H01J49/14
代理机构 代理人
主权项 1. In a mass spectrometer, a method for ionizing a sample, comprising: irradiating a sample at an ambient pressure in a range of about 10−5 Torr to about 105 Torr with one or more radiation pulses having a pulsewidth in a range of about 2 fs to about 1 ps at a pulse power density in a range of about 1 TW/cm2 to about 1000 TW/cm2 to cause ionization of at least a portion of the sample.
地址 Singapore SG