| 摘要 |
<p>A test set-up (10) for non-destructive detection of a flaw in a device under test by means of an eddy current comprises an excitation coil (14), to which an excitation signal (SE) can be provided to act on the device under test (16) with an electromagnetic alternating field, a receiving coil (17) to generate a coil signal (SP), which is a function of the flaw in the device under test (16), an analog-digital converter (21), which is coupled to the receiving coil (17) on the input side, a filter arrangement (22), which is coupled to the analog-digital converter (21) on the input side and is designed for band-pass filtering and scan rate reduction, and a demodulator (27), which is coupled to an output of the filter arrangement (22) on the input side.</p> |
